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Comparison of Glass Fragments Using Particle-Induced X-Ray Emission (PIXE) Spectrometry

NCJ Number
234428
Journal
Journal of Forensic Sciences Volume: 56 Issue: 2 Dated: March 2011 Pages: 366-371
Author(s)
Paul A. DeYoung, Ph.D.; Christopher C. Hall, B.S.; Patrick J. Mears, B.S.; Derek J. Padilla, B.S.; Richard Sampson, B.S.; Graham F. Peaslee, Ph.D.
Date Published
March 2011
Length
6 pages
Annotation

A procedure has been developed to analyze the trace element concentrations in glass fragments using particle-induced X-ray emission (PIXE) spectrometry.

Abstract

This method involves using accelerated protons to excite inner-shell electronic transitions of target atoms and recording the resultant X-rays to characterize the trace element concentrations. The protocol was able to identify those glass fragments that originated from different sources based on their elemental analyses. The protocol includes specific approaches to calculating uncertainties and handling measurements below the level of detection. The results indicate that this approach has increased sensitivity for several elements with higher atomic number compared with X-ray fluorescence methods. While not as sensitive as laser-ablation or inductively coupled plasma mass spectrometry methods of dissolved samples, it is entirely nondestructive and entails a much simpler sample preparation process that may be used to presort glass fragments for more comprehensive elemental analysis. As such, the technique described may have a niche role in forensic glass analysis. (Published Abstract)

Date Published: March 1, 2011