Electron microscopy
Identification of factors affecting SEM/EDS analysis for discrimination and classification among common items of evidence using particle combination profiles
NCJ Number
304107
Journal
Forensic Science International
Date Published
January 2022
Agencies
NIJ-Sponsored
Publication Link
Transmission Infrared Microscopy and Machine Learning Applied to the Forensic Examination of Original Automotive Paint
NCJ Number
304105
Journal
Applied Spectroscopy
Date Published
December 2021
Agencies
NIJ-Sponsored
Publication Link
Results of the 3D Virtual Comparison Microscopy Error Rate (VCMER) Study for firearm forensics
NCJ Number
304032
Journal
Journal of Forensic Sciences
Date Published
2021
Agencies
NIJ-Sponsored
Publication Link
High-yield large scale laser patterning of magnetic nanoparticles
NCJ Number
303319
Journal
Journal of Magnetism and Magnetic Materials
Date Published
2019
Agencies
NIJ-Sponsored
Publication Link
Open source software tool for the automated detection and characterization of epithelial cells from trace biological samples
NCJ Number
302913
Journal
Forensic Science International
Date Published
2020
Agencies
NIJ-Sponsored
Publication Link
SEM-EDS analysis and characterization of glitter and shimmer cosmetic particles
NCJ Number
302826
Journal
Forensic Science International
Date Published
December 2020
Agencies
NIJ-Sponsored
Publication Link
Evaluation of the Vision X Comparison Microscope to Share Digital Images of Bullets and Shell Casings and the Potential Impact on the Firearms and Tool Marks Community
Date Published
2020
Agencies
NIJ-Sponsored
Evaluation of 3D Virtual Comparison Microscopy for Firearm Forensics within the Crime Lab
Date Published
December 2020
Agencies
NIJ-Sponsored
Discrimination and Classification among Common Items of Evidence using Particle Combination Profiles
NCJ Number
255718
Journal
Forensic Science International
Date Published
2018
Agencies
NIJ-Sponsored
Publication Link
Characterization of toners and inkjets by laser ablation spectrochemical methods and Scanning Electron Microscopy-Energy Dispersive X-ray Spectroscopy
NCJ Number
255553
Journal
Spectrochimica Acta Part B: Atomic Spectroscopy
Date Published
2013
Agencies
NIJ-Sponsored
Publication Link
PLM/Microprobe: An Electron Microprobe for Use on a Light Microscope Stage Designed for Trace Evidence Analysis: Final Report
Date Published
1998
Agencies
NIJ-Sponsored